CSR article – Reducing wafer test time

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Our CEO Klemens Reitinger has contributed to the Jan/Feb issue of Chip Scale Review magazine with an article discussing the importance of reducing wafer test time.

“This article will explain why it is so important to generate new solutions that reduce the expensive waiting time in the overall test process, and how ERS’ new thermal wafer test chuck system is designed to improve this longstanding issue.”

Click the pdf link above to read more!