Category: Events & Exhibitions (Page 7 of 7)

Dynamic Thermal Shield: Higher Throughput and More Reliable Results in Wafer Test

ERS electronic GmbH, technology leader in air-cooled chuck systems for semiconductor manufacturing, is announcing a technology break-through that significantly improves measurement precision during wafer test. ERS electronic’s new Dynamic Thermal Shield (DTS) helps semiconductor manufacturers to achieve better test results faster. DTS is an add-on to ERS’ existing wafer chuck ...