AC3 modular patented air-only chuck system

Fully integrated hot/cold solutions for all major production and laboratory wafer probers

  • No liquids or Peltier elements
  • MTBF > 50,000 hours
  • Temperature ranges from -65 to +400 °C
  • Modular system, adaptable to individual testing requirements
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New: AC3 Fusion

The AC3 Fusion thermal chuck system is available to order now.
The system offers three pre-set modes and one custom mode that can be configured on-site, making the AC3 Fusion a no-compromise solution for energy-efficient and flexible tri-temperature wafer test. Learn more about the sustainable and versatile solution for tri-temp wafer test here.

ERS’s AC3 provides a full temperature range with air reliability and unmatched chiller compactness.

  • Air only – no liquids or Peltier elements
  • MTBF > 50,000 hours
  • Temperature ranges from -65 to +400 °C
  • Modular system, adaptable to individual testing requirements
  • Low-noise capability in the fA-range
  • Space-saving chiller dimensions
  • No separate purge air source required
  • Compatible with all major production probers and all major analytical probers
  • Full hardware and software integrations available
  • Service-friendly FRU (Field Replacement Units) component

Air-only cold test for 24-hour reliable operation

In use at renowned production floors and research laboratories world-wide, the patented AC3 system is famous for its wide temperature range, compact chiller, low power requirements and air-only reliability. Highest system uptimes, compact footprint in the clean room and reduced utilities costs translate to the lowest COO in the industry.

Unrivalled efficiency thanks to the patented ACP Technology

The core technology of the highly efficient AC3 is the patented ACP air management system. ACP extracts maximum effect from the chilled coolant air in a two-pass cooling operation. The expended super-dry, clean coolant air is then available as a cost-saving purge gas to prevent icing on the wafer and the surrounding area.

High performance for both laboratory and production environment

Close cooperation over the years with both the laboratory end-user and with the vendors of high-quality analytical wafer probers has produced the best performance in low-noise test. The demands of the wafer sort floor during high pin-count test are also met due to the high rigidity of the AC3 wafer chuck.


Available upper temperature limits
+150°C up to +300°C, +400 °C option available
Available lower temperature limits
+35, +20, -40, -55 °C
Air (user supplied)
Chuck Temperature Display Resolution
Smallest Temperature Selection Step
Temperature accuracy
±0.1 °C
Max. voltage between chuck top and GND
500 V DC (high voltage option up to 10 kV available)
Surface flatness and base parallelism
-55 °C up to +300 °C < ±12µm (tighter range on request)
Temperature uniformity
- 55 °C to +200 °C < ±0.5 °C
> 200 °C < ±0.5 %
Electrical Isolation STD
> 2,5 T Ohm at +25 °C
Temperature sensor
Pt100 1/3DIN, 4-line wired
Chuck surface plating
Nickel (gold or non-conductive available)
RS232C, Ethernet, others on request
Control method
Low noise DC/PID with Temperature Dynamic Control TDC
Heating rates for 300 mm system
- 55 °C to +25°C:  12 min
- 40 °C to +25°C:  10 min
+25 °C to +150 °C: 20 min
+25 °C to +200 °C:  28 min
+25 °C to +300 °C:  40 min
Cooling Rates for 300 mm system
+150 °C to +25 °C: 25 min
+200 °C to +25 °C: 30 min
+300 °C to +25 °C: 40 min
+25 °C to - 20 °C: 15 min
+25 °C to -40 °C: 35 min
+25 °C to -55 °C: 65 min

For special requirements, please contact us.